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Company Profile
JEOL NEWS
Product Guide
Transmission Electron Microscope (TEM)
Options (TEM)
Integrated Dynamic Electron Solutions, Inc. / Products (TEM)
Scanning Electron Microscope (SEM)
Options (FE-SEM)
Conventional SEM
Ion Beam Application Equipment (FIB, CP)
Options (FIB)
Specimen Preparation Equipment (CP)
Options (CP)
Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)
Options (EPMA)
Auger Microprobe (Auger)
Options (Auger)
Nuclear Magnetic Resonance Spectrometer (NMR)
Electron Spin Resonance Spectrometer (ESR)
X-ray Fluorescence Spectrometer (XRF)
Mass Spectrometer (MALDI-TOFMS, GC-MS, LC-MS)
Options (GC-MS)
LC-MS (DART™-MS), MALDI-TOFMS
Options (LC-MS (DART™-MS), MALDI-TOFMS)
MS Guidebook
Semiconductor Equipment
Additive Manufacturing Machine (AM)
Industrial Equipment for thin-film formation and material processing
Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)
YOKOGUSHI Application Notes
Environmental countermeasure for analytical instruments

Company Profile

Company Profile

Company Profile
( No registration required )

JEOLNEWS

JEOL NEWS Vol.59 No.1, 2024

JEOL NEWS Vol.59 No.1, 2024

Product Guide

Product Guide

Product Guide
( No registration required )

Transmission Electron Microscope (TEM)

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope

JEM-Z200CA (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-Z200CA (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-F200 Multi-purpose Electron Microscope

JEM-2200FS Field Emission Electron Microscope

JEM-2200FS Field Emission Electron Microscope

EM-2100Plus Electron Microscope

JEM-2100Plus Electron Microscope

JEM-1400Flash Electron Microscope

JEM-1400Flash Electron Microscope

JEM-120i Electron Microscope

JEM-120i Electron Microscope

Options (TEM)

SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

SightSKY EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera

OBF System

OBF System

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

JEM-1400/JEM-1400Plus Upgrading with Flash Camera

SAAF Octa Segmented Annular All Field Detector Octa

SAAF Octa Segmented Annular All Field Detector Octa

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Pixelated STEM Detector

4DCanvas™ Application Data book

4DCanvas™ Application Data book

FEMTUS™ Integrated Analysis Platform -EDS Edition-

FEMTUS™ Integrated Analysis Platform -EDS Edition-

Integrated Dynamic Electron Solutions, Inc. / Products (TEM)

Product Brochure (Integrated Dynamic Electron Solutions, Inc.)

Product Brochure (IDES)

IDES Application note A STEM Imaging for Electron-Beam Sensitive Sample 'Zeolite'

IDES Application note A STEM Imaging for Electron-Beam Sensitive Sample "Zeolite"

IDES Application note True Area STEM Imaging with reduced beam damage

IDES Application note True Area STEM Imaging with reduced beam damage

Scanning Electron Microscope (SEM)

SEM Series

SEM Series

SEM Series

FE-SEM

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

Options (FE-SEM)

Neo Comfort FE-SEM Acoustic Enclosure

Neo Comfort FE-SEM Acoustic Enclosure

SM-92100EUVC EXCIMER UV CLEANER

SM-92100EUVC EXCIMER UV CLEANER

Gather-X JED Series Dry SD™ Windowless EDS

Gather-X JED Series Dry SD™ Windowless EDS

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

SEM Array Tomography

Three dimensional reconstruction of a tissue specimen Array tomography

Conventional SEM

JSM-IT710HR Scanning Electron Microscope

JSM-IT710HR Scanning Electron Microscope

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT510 InTouchScope™ Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

JSM-IT210 Scanning Electron Microscope

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Versatile Benchtop SEM

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

Ion Beam Application Equipment (FIB, CP)

MultiBeam System (FIB)

JIB-PS500i FIB-SEM system

JIB-PS500i FIB-SEM system

JIB-4700F Multi Beam System

JIB-4700F Multi Beam System

Options (FIB)

CRYO-FIB-SEM Cryolameller

CRYO-FIB-SEM Cryolameller

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

Specimen Preparation Equipment (CP)

IB-19540CP/IB-19550CCP 4P

IB-19540CP/IB-19550CCP CROSS SECTION POLISHER™

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System

IB-19520CCP CROSS SECTION POLISHER™

IB-19520CCP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

IB-19530CP CROSS SECTION POLISHER™

Options (CP)

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)

  • EPMA is an abbreviation of Electron Probe Microanalyzer.

Electron Probe Microanalyzer (EPMA)

WDS Application data

WDS Application data

JXA-iHP200F Schottky field emission Electron Probe Microanalyzer JXA-iSP100 Tungsten/LaB<sub>6</sub> Electron Probe Microanalyzer

JXA-iHP200F/JXA-iSP100 Electron Probe Microanalyzer

Options (EPMA)

SS-94000SXES/SS-94040SXSER Super Spectrometer

SS-94000SXES/SS-94040SXSER Super Spectrometer

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Handbook of Soft X-ray Emission Spectra Version 8.0 (July. 2023)

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

Soft X-ray Emission Spectrometer SXES-LR/ER, -LREP/EREP

Auger Microprobe (Auger)

JAMP-9510F Field Emission Auger Microprobe

JAMP-9510F Field Emission Auger Microprobe

Options (Auger)

Spectrum Image

Spectrum Image

Photoelectron Spectrometer (ESCA)

JPS-9030 Photoelectron Spectrometer (XPS)

JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

JNM-ECZL series FT NMR

JNM-ECZL series FT NMR

Solid State NMR

Solid State NMR

qNMR

qNMR Quantitative Analysis by NMR

Cryogen Reclamation System

Cryogen Reclamation System

ROYALPROBE™ HFX

ROYALPROBE™ HFX

Data Integrity Compliance of JEOL NMR

Data Integrity Compliance of JEOL NMR

ROYALPROBE™ AUTOMAS

ROYALPROBE™ AUTOMAS

SuperCOOL MARVEL

SuperCOOL MARVEL

Electron Spin Resonance Spectrometer (ESR)

JES-X3 Series Electron Spin Resonance Spectrometer

JES-X3 Series Electron Spin Resonance Spectrometer

Option(ESR)

Electron Spin Resonance Spectrometers Attachment Brochure

Electron Spin Resonance Spectrometers Attachment Brochure

X-ray Fluorescence Spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

JSX-1000S X-ray fluorescence spectrometer (XRF)

Options (XRF)

Low Vacuum Liquid Specimen Capsule

Low Vacuum Liquid Specimen Capsule

Mass Spectrometer(MS)

GC-MS

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha　High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-T2000GC AccuTOF™ GC-Alpha　High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer

JMS-TQ4000GC UltraQuad™TQ

JMS-TQ4000GC UltraQuad™TQ

JMS-TQ4000GC for Dioxins

JMS-TQ4000GC for Dioxins

JMS-800D High-Resolution Mass Spectrometer

JMS-800D High-Resolution Mass Spectrometer

Options (GC-MS)

msFineAnalysis AI ver.2 Unknown Compounds Structure Analysis Software

msFineAnalysis AI ver.2 Unknown Compounds Structure Analysis Software

msFineAnalysis series (GC-MS integrated qualitative analysis software)

msFineAnalysis series (GC-MS integrated qualitative analysis software)

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

LC-MS (DART™-MS), MALDI-TOFMS

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer

JMS-S3000 SpiralTOF™-plus 3.0 Ultra-High Mass-Resolution MALDI-TOFMS System

JMS-S3000 SpiralTOF™-plus 3.0 Ultra-High Mass-Resolution MALDI-TOFMS System

Options (LC-MS (DART™-MS), MALDI-TOFMS)

msRepeatFinder Polymer Analysis Software

msRepeatFinder Polymer Analysis Software

MALDI-TOFMS imaging system　JEOL×SCiLS

MALDI-TOFMS imaging system　JEOL×SCiLS

MS Guidebook

JEOL GC-MS Primer - A Guidebook -

JEOL GC-MS Primer - A Guidebook -

Polymeric Materials Analysis by JEOL Mass Spectrometers - A Guidebook

Polymeric Materials Analysis by JEOL Mass Spectrometers - A Guidebook

GC-MS Soft Ionization Mass_Spectra Collection

GC-MS Soft Ionization Mass_Spectra Collection

Ionization Methods for JEOL Mass Spectrometers - A Guidebook -

Ionization Methods for JEOL Mass Spectrometers - A Guidebook -

Semiconductor Equipment

JBX Series Electron Beam Lithography System

JBX Series Electron Beam Lithography System

JBX-A9 Series Electron Beam Lithography System

JBX-A9 Series Electron Beam Lithography System

JBX-8100FS Series Electron Beam Lithography System

JBX-8100FS Series Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

JBX-9500FS Electron Beam Lithography System

Additive Manufacturing Machine (AM)

JAM-5200EBM Electron Beam Metal AM Machine

JAM-5200EBM Electron Beam Metal AM Machine

JEOL Additive Manufacturing New Technical Information

JEOL Additive Manufacturing New Technical Information

Industrial Equipment for thin-film formation and material processing

Industrial Equipment General Catalog

Industrial Equipment General Catalog

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies

BS-60610BDS Bombardment Deposition Source

BS-60610BDS Bombardment Deposition Source

BS-60250DEM Electron Beam Source

BS-60250DEM Electron Beam Source

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply

BS-40 Series Rotary Sensor

BS-40 Series Rotary Sensor

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)

RF Induction Thermal Plasma System

RF Induction Thermal Plasma System

TP-40020NPS Thermal Plasma Nanopowder Synthesis System

TP-40020NPS Thermal Plasma Nanopowder Synthesis System

TP-99140FDR Fine Powder Feeder

TP-99140FDR Fine Powder Feeder

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

YOKOGUSHI Application Notes

LIBnote

LIBnote

Solid-State Battery Note

Solid-State Battery Note

Cleanliness Inspection of Automotive Lithium-ion Batteries Manufacture

Cleanliness Inspection of Automotive Lithium-ion Batteries Manufacture

BatteryNote

BatteryNote

Polymer note

Polymer note

Food note

Food note

Food Analysis Solutions

Food Analysis Solutions

Bio note

Bio note

CryoNote

CryoNote

Bio Photographs SEM biological photo album

Bio Photographs SEM biological photo album

CLEM note Crrelative Light and Electron Microscopy

CLEM note Crrelative Light and Electron Microscopy

Urushi Note

Urushi Note

Environmental countermeasure for analytical instruments

Environmental Engineering Technology for Advanced Analytical Instruments

Environmental Engineering Technology for Advanced Analytical Instruments
( No registration required )

Room temperature control / Airflow countermeasure

Room temperature control / Airflow countermeasure
( No registration required )

Magnetic field countermeasure

Magnetic field countermeasure
( No registration required )

Vibration countermeasure

Vibration countermeasure
( No registration required )

Related products (Environmental countermeasure for analytical instruments)

FS-78210AMC Active Magnetic Field Canceller System for Scientific Instruments

FS-78210AMC Active Magnetic Field Canceller System for Scientific Instruments
( No registration required )

DS-78600CWS Circulating Water Stabilizing System for Analytical Instruments

DS-78600CWS Circulating Water Stabilizing System for Analytical Instruments
( No registration required )

EST-L6HF-A017 Active Vibration Isolation System for JEM-ARM300F2

EST-L6HF-A017 Active Vibration Isolation System for JEM-ARM300F2
( No registration required )

　　　　　　　　
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JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.

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